CVE-2026-68991

Memory Corruption via Improper Input Validation in Exynos ENN NeuralNetworks HAL Leading to Denial of Service

Published Nov 5, 2026 CVSS 3.1 · 9.8 Critical EPSS < 1% KEV · Not listed
Description
In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.

Remediation

No solution or workaround provided in the CVE record

Tracking

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Advisories

No advisories available
History
Type Values Removed Values Added
Metrics ssvc

{'options': {'Automatable': 'yes', 'Exploitation': 'none', 'Technical Impact': 'total'}, 'version': '2.0.3'}

Type Values Removed Values Added
Metrics cvssV3_1

{'score': 9.8, 'vector': 'CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H'}

Type Values Removed Values Added
First Time appeared Samsung Semiconductor
Samsung Semiconductor exynos 1480
Samsung Semiconductor exynos 2400
Vendors & Products Samsung Semiconductor
Samsung Semiconductor exynos 1480
Samsung Semiconductor exynos 2400
Type Values Removed Values Added
Title Memory Corruption via Improper Input Validation in Exynos ENN NeuralNetworks HAL Leading to Denial of Service
Type Values Removed Values Added
Description In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.
Weaknesses CWE-787
References
Weaknesses

Sources

Status
PUBLISHED
Assigner
samsungsemiconductor
Published
Updated
Nov 10, 2026, 1:23 PM
Reserved
Aug 3, 2026, 6:35 AM
Status
Deferred
Published
Nov 5, 2026, 3:17 AM
Modified
Nov 10, 2026, 2:17 PM