CVE-2018-13888

Published Feb 11, 2019 CVSS 3.0 · 7.8 High EPSS < 1% KEV · Not listed
Description
There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.

Remediation

No solution or workaround provided in the CVE record

Tracking

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Advisories

Source ID Title
EUVD EUVD EUVD-2018-5822 There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
History

No history.

Weaknesses

Sources

Status
PUBLISHED
Assigner
qualcomm
Published
Updated
Aug 5, 2024, 9:14 AM
Reserved
Jul 11, 2018, 12:00 AM
Status
Modified
Published
Feb 11, 2019, 3:29 PM
Modified
Jun 17, 2026, 1:40 AM