Use After Free in Automotive Android OS
Memory corruption may occur while accessing a variable during extended back to back tests.
Memory corruption may occur while accessing a variable during extended back to back tests.
Memory corruption in display driver while detaching a device.
Memory corruption while calling the NPU driver APIs concurrently.
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
Memory corruption while parsing the ML IE due to invalid frame content.
Memory corruption during concurrent access to server info object due to incorrect reference count update.
Memory corruption during memory assignment to headless peripheral VM due to incorrect error code handling.
Memory corruption during memory mapping into protected VM address space due to incorrect API restrictions.
Memory corruption while triggering commands in the PlayReady Trusted application.
Memory corruption during the FRS UDS generation process.
Memory corruption while processing a data structure, when an iterator is accessed after it has been removed, potential failures occur.
Memory corruption while reading the FW response from the shared queue.
Memory corruption while reading response from FW, when buffer size is changed by FW while driver is using this size to write null character at the end of buffer.
Memory corruption while processing image encoding, when configuration is NULL in IOCTL parameter.
Memory corruption while processing escape code, when DisplayId is passed with large unsigned value.
Memory corruption occurs during the copying of read data from the EEPROM because the IO configuration is exposed as shared memory.
Memory corruption can occur when TME processes addresses from TZ and MPSS requests without proper validation.
Memory corruption while processing multiple IOCTL calls from HLOS to DSP.