Out-of-bounds Write in Automotive
Memory Corruption when accessing buffers with invalid length during TA invocation.
Memory Corruption when accessing buffers with invalid length during TA invocation.
Memory corruption while handling different IOCTL calls from the user-space simultaneously.
Memory Corruption while invoking IOCTL calls when concurrent access to shared buffer occurs.
Memory Corruption when concurrent access to shared buffer occurs due to improper synchronization between assignment and deallocation of buffer resources.
Transient DOS when an LTE RLC packet with invalid TB is received by UE.
Weak configuration may lead to cryptographic issue when a VoWiFi call is triggered from UE.
Memory Corruption when concurrent access to shared buffer occurs during IOCTL calls.
Memory Corruption when accessing a buffer after it has been freed while processing IOCTL calls.
Memory Corruption when adding user-supplied data without checking available buffer space.
Cryptographic issue while performing RSA PKCS padding decoding.
Memory Corruption when initiating GPU memory mapping using scatter-gather lists due to unchecked IOMMU mapping errors.
Memory Corruption while deallocating graphics processing unit memory buffers due to improper handling of memory pointers.
Memory Corruption in SPS Application while exporting public key in sorter TA.
Memory corruption while loading an ELF segment in TEE Kernel.
Transient DOS may occur while processing malformed length field in SSID IEs.
Memory Corruption in Multi-mode Call Processor while processing bit mask API.
Information disclosure while processing the hash segment in an MBN file.
Information disclosure while reading data from an image using specified offset and size parameters.
Memory corruption due to improper check to return error when user application requests memory allocation of a huge size in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables